Controlling the manufacturing costs of integrated circuits while increasing their density is of a paramount importance to maintain a certain degree of profitability in the semi-conductor industry. Among various components of a circuit, we are interested in vertical metallic connections known as “vias”. During manufacturing, a complex lithography process is used to form an arrangement of vias on a silicon wafer support, using an optical mask. For manufacturing reasons, a minimum distance between the vias must be respected. Whenever this is not the case, we are talking about a “conflict”. In order to eliminate these conflicts, the industry uses a technique that decomposes an arrangement of vias in several subsets, where minimum distance con...
This thesis, whose topic is quantum chemistry algorithms, is made in the context of the change in pa...
Tesi en modalitat de cotutela: Universitat Politècnica de Catalunya i École Centrale de NantesIdenti...
Tesi en modalitat de cotutela: Universitat Politècnica de Catalunya i École Centrale de NantesIdenti...
Technology shrinking and voltage scaling increase the risk of fault occurrences in digital circuits....
Technology shrinking and voltage scaling increase the risk of fault occurrences in digital circuits....
The main objective of this thesis is to develop analysis and mitigation techniques that can be used ...
The main objective of this thesis is to develop analysis and mitigation techniques that can be used ...
The main objective of this thesis is to develop analysis and mitigation techniques that can be used ...
Integration of disassembly operations during product design is an important issue today. It is estim...
Recently, the race for miniaturization has seen its growth slow because of technological challenges ...
Integration of disassembly operations during product design is an important issue today. It is estim...
Integration of disassembly operations during product design is an important issue today. It is estim...
Logic programming and constraint programming are two declarative programming paradigms which rely on...
Time-to-market and implementation cost are high-priority considerations in the automation of digital...
In this thesis we have explored the co-designed paradigm to show alternative processor design points...
This thesis, whose topic is quantum chemistry algorithms, is made in the context of the change in pa...
Tesi en modalitat de cotutela: Universitat Politècnica de Catalunya i École Centrale de NantesIdenti...
Tesi en modalitat de cotutela: Universitat Politècnica de Catalunya i École Centrale de NantesIdenti...
Technology shrinking and voltage scaling increase the risk of fault occurrences in digital circuits....
Technology shrinking and voltage scaling increase the risk of fault occurrences in digital circuits....
The main objective of this thesis is to develop analysis and mitigation techniques that can be used ...
The main objective of this thesis is to develop analysis and mitigation techniques that can be used ...
The main objective of this thesis is to develop analysis and mitigation techniques that can be used ...
Integration of disassembly operations during product design is an important issue today. It is estim...
Recently, the race for miniaturization has seen its growth slow because of technological challenges ...
Integration of disassembly operations during product design is an important issue today. It is estim...
Integration of disassembly operations during product design is an important issue today. It is estim...
Logic programming and constraint programming are two declarative programming paradigms which rely on...
Time-to-market and implementation cost are high-priority considerations in the automation of digital...
In this thesis we have explored the co-designed paradigm to show alternative processor design points...
This thesis, whose topic is quantum chemistry algorithms, is made in the context of the change in pa...
Tesi en modalitat de cotutela: Universitat Politècnica de Catalunya i École Centrale de NantesIdenti...
Tesi en modalitat de cotutela: Universitat Politècnica de Catalunya i École Centrale de NantesIdenti...